terahertz

High-Precision Displacement Terahertz Probe

Flexible deployment, ranging accuracy is 4 times that of conventional millimeter wave radar chips.

COST
CMOS process chip, high cost performance
SAFETY
Low power consumption, no ionizing radiation hazard
CONVENIENT
real-time imaging,
Real-time calculation and measurement of two-dimensional distributions of parameters
ASSURE
Professional R&D team guarantees key core technologies

Measurement function: Real-time detection of the liquid level height and height change of the molten silicon in the crystal pulling furnace, and outputting the liquid level change data to the industrial computer of the crystal pulling furnace. This data will be used to adjust the position of the quartz crucible to ensure that the molten silicon liquid level is always at the The best position for crystal pulling and forming.
Performance:
1. Working frequency: 57~71GHz
2. Transmit power: >10dBm
3. Test distance: >2m
4. Absolute ranging accuracy: 1.0mm
5. Minimum detection accuracy of liquid level change: 0.3mm
Features:
1. Not affected by furnace temperature
2. Not affected by the high brightness of molten silicon
Difficulties in measurement: The temperature in the crystal pulling furnace is as high as over 600°C, and the temperature near the molten silicon liquid surface is as high as over 1000°C. Conventional testing methods cannot penetrate into the crystal pulling furnace. Moreover, due to the structural problems of the crystal pulling furnace, it is easy to have blind spots in the field of vision, which cannot be achieved by ordinary ranging radars. At present, CCD (Charge Coupled Devices) measurement method is mainly used.